25 results
Live Measurement of Electrical Charge Density in Materials using Off-Axis Electron Holography
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- Journal:
- Microscopy and Microanalysis / Volume 25 / Issue S2 / August 2019
- Published online by Cambridge University Press:
- 05 August 2019, pp. 44-45
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- August 2019
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Electron Holography, a Routine Application Workflow
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- Microscopy and Microanalysis / Volume 24 / Issue S1 / August 2018
- Published online by Cambridge University Press:
- 01 August 2018, pp. 1462-1463
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- August 2018
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STEM and TEM: Disparate Magnification Definitions and a Way Out.
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- Microscopy and Microanalysis / Volume 23 / Issue S1 / July 2017
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- 04 August 2017, pp. 56-57
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- July 2017
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Exploring CCD Camera Parameters with Off-Axis Electron Holography
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- Microscopy and Microanalysis / Volume 17 / Issue S2 / July 2011
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- 08 April 2017, pp. 916-917
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- July 2011
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Using Off-axis Type Holography for CCD Camera Characterization
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 580-581
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- July 2010
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Optimizing Phase Resolution for Off-Axis-Type Holograms at 2π/1000 Levels
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- Microscopy and Microanalysis / Volume 16 / Issue S2 / July 2010
- Published online by Cambridge University Press:
- 01 August 2010, pp. 584-585
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- July 2010
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Practical Determination of Spatial Resolution in Atom Probe Tomography
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 12-13
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- July 2009
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Using Holography to Evaluate CCD Camera Characteristics with High Accuracy
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- Microscopy and Microanalysis / Volume 15 / Issue S2 / July 2009
- Published online by Cambridge University Press:
- 26 July 2009, pp. 1100-1101
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- July 2009
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Improving Image Quality and Reducing Drift Problems via Automated Data Acquisition and Averaging in a Cs-Corrected TEM
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- Microscopy Today / Volume 16 / Issue 6 / November 2008
- Published online by Cambridge University Press:
- 14 March 2018, pp. 36-39
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- November 2008
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Routine Phase Resolution of 2π/100 and Better in Off-axis (Electron) Holography
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 840-841
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- August 2008
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Improving Image Quality and Reducing Drift Problems via Automated Data Acquisition and Averaging in Cs-corrected TEM
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- Microscopy and Microanalysis / Volume 14 / Issue S2 / August 2008
- Published online by Cambridge University Press:
- 03 August 2008, pp. 844-845
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- August 2008
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Noise Level in Electron Holograms: The Impact of CCD Camera- and Hologram Reconstruction Parameters
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- Microscopy and Microanalysis / Volume 13 / Issue S02 / August 2007
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- 05 August 2007, pp. 138-139
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- August 2007
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Simulating Shot Noise in Electron Holograms -- Recorded Digitally
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- Microscopy and Microanalysis / Volume 12 / Issue S02 / August 2006
- Published online by Cambridge University Press:
- 31 July 2006, pp. 1668-1669
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- August 2006
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The Side-Effects of a Non-Mechanical Shutter in the Gun Area of a Transmission Electron Microscope for Off-Axis Electron Holography
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- Microscopy and Microanalysis / Volume 11 / Issue S02 / August 2005
- Published online by Cambridge University Press:
- 01 August 2005, pp. 572-573
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- August 2005
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Off-axis Electron And Light Optical Holograms: How They Process And How They Compare
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- Microscopy and Microanalysis / Volume 9 / Issue S02 / August 2003
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- 21 July 2003, pp. 96-97
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- August 2003
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Present Concepts and Designs for Gun Monochromators
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 922-923
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- August 2001
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The ORNL Aberration-Corrected STEM/TEM Project
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 906-907
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- August 2001
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Eliminating effects of biprism drift in electron holography
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- Microscopy and Microanalysis / Volume 7 / Issue S2 / August 2001
- Published online by Cambridge University Press:
- 02 July 2020, pp. 990-991
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- August 2001
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Teaching Microscopy and Microscope Theory Based on Remote Instrument Access and Instrument Automation
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- Microscopy and Microanalysis / Volume 6 / Issue S2 / August 2000
- Published online by Cambridge University Press:
- 02 July 2020, pp. 1162-1163
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- August 2000
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Electron Holography of Magnetic Memory Cells
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- Microscopy and Microanalysis / Volume 5 / Issue S2 / August 1999
- Published online by Cambridge University Press:
- 02 July 2020, pp. 944-945
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- August 1999
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